Project information
Physical properties of new materials and layered structures

Information

This project doesn't include Faculty of Economics and Administration. It includes Faculty of Science. Official project website can be found on muni.cz.

Project Identification

MSM 143100002

Project Period

1/1999 - 12/2004

Investor / Pogramme / Project type

Ministry of Education, Youth and Sports of the CR

Research Intents

MU Faculty or unit

Faculty of Science

prof. RNDr. Josef Humlíček, CSc.

Keywords

semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection

Results

Publications

Total number of publications: 212

2004

Annealing studies of high Ge composition Si/SiGe multilayers

MEDUŇA Mojmír NOVÁK Jiří HOLÝ Václav BAUER Günther FALUB Claudiu TSUJINO Soichiro MÜLLER Elisabeth GRÜTZMACHER Detlev CAMPIDELLI Yves KERMARREC Olivier BENSAHEL Daniel

Article in Periodical

Zeitschrift fur Kristalographie, year: 2004, volume: 219, edition: 4
Anomalous oxygen-isotope effect on the in-plane far-infrared conductivity of detwinned (YBa2Cu3O6.9)-O-16,18

BERNHARD Christian HOLDEN Todd BORIS Alexandr KOVALEVA Natalia PIMENOV Alexei HUMLÍČEK Josef

Article in Periodical

Physical Review B, year: 2004, volume: 69, edition: 5
Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation

KLAPETEK Petr OHLÍDAL Ivan NAVRÁTIL Karel

Article in Periodical

Microchimica Acta, year: 2004, volume: 147, edition: 3
Diffraction effects in infrared ellipsometry of conducting samples

HUMLÍČEK Josef BERNHARD Christian

Article in Periodical

Thin Solid Films, year: 2004, volume: 455-456, edition: 1
Electronic Structure and Optical Properties of InAs/GaAs Quantum Dots

KŘÁPEK Vlastimil FIKAR Jan HUMLÍČEK Josef

Article in Proceedings

WDS'04 Proceedings of contributed papers, year: 2004
Experimental study of Ni3Al slip traces by atomic force microscopy: an evidence of mobile dislocation exhaustion

FIKAR Jan COUPEAU Christophe KRUML Tomáš BONNEVILLE Joel

Article in Periodical

Materials Science and Engineering A, year: 2004, volume: 387-389, edition: 1
Far-infrared ellipsometry using a synchrotron light source - the dielectric response of the cuprate high Tc superconductors

BERNHARD Christian HUMLÍČEK Josef KEIMER Bernhard

Article in Periodical

Thin Solid Films, year: 2004, volume: 455-456, edition: 1
High-resolution diffuse x-ray scattering from threading dislocations in heteroepitaxial layers

HOLÝ Václav DANIŠ Stanislav BAUER Guenther ZHONG Zhenyang

Article in Periodical

Applied Physics Letters, year: 2004, volume: 85, edition: 7
High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures

HOLÝ Václav PIETSCH Ullrich BAUMBACH Tilo

Monograph

Year: 2004, number of pages: 408 s.
Infrared Absorption Spectroscopy of Oxygen Precipitates in Czochralski Silicon

ŠTOUDEK Richard HUMLÍČEK Josef

Article in Proceedings

WDS'04 Proceedings of Contributed Papers, year: 2004