Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
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Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 212
2003
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Structural study of self-assembled Co nanoparticles
J. Appl. Phys., year: 2003, volume: 94, edition: 2
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Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping
J. Phys. D: Appl. Phys., year: 2003, volume: 36, edition: 1
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Two-dimensional x-ray magnification based on a monolithic beam conditioner
J. Phys. D: Appl. Phys., year: 2003, volume: 36, edition: 1
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X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires
Nuclear Instruments & Methods in Physics Research A, year: 2003, volume: 200, edition: 4
2002
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Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation
Materials Structure, year: 2002, volume: 9, edition: 2
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Diffuse x-ray reflectivity from self-assembled ripples with superimposed roughness in Si/Ge superlattices
Semicond. Sci. Technol., year: 2002, volume: 17, edition: 1
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Effect of overgrowth on shape, composition, and strain of SiGe islands on Si(001)
Physical Review B, year: 2002, volume: B66, edition: 5
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Influence of GaN domain size on the electron mobility of two-dimensional electron gases in Al-GaN/GaN heterostructures determined by x-ray reflectivity and diffraction
Appl. Phys. Lett., year: 2002, volume: 80, edition: 3
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In-plane polarized collective modes in detwinned YBa2Cu3O6.95 observed by spectral ellipsometry
Solid state communications, year: 2002, volume: 121, edition: 2
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Investigation of morphology and chemical composition of self-organized semiconductor quantum dots and wires by X-ray scattering
Acta Physica Polonica, year: 2002, volume: A102, edition: 3