Optical constants of ZnTe and ZnSe epitaxial thin films

• Autoři: FRANTA Daniel; OHLÍDAL Ivan; KLAPETEK Petr; MONTAIGNE-RAMIL Alberto; BONANNI Alberta; STIFTER David; SITTER Helmut
• Rok publikování: 2003
• Druh: Článek v odborném periodiku
• Časopis / Zdroj: Acta Physica Slovaca
• Fakulta / Pracoviště MU: Přírodovědecká fakulta
• www: http://hydra.physics.muni.cz/~franta/bib/APS53_95.html
• Obor: Fyzika pevných látek a magnetismus
• Klíčová slova: SPECTROSCOPIC ELLIPSOMETRY; MATRIX FORMALISM; CARBON-FILMS; MULTISAMPLE; GAAS
• Popis: In this paper the spectral dependences of the optical constants, i.e. refractive index and extinction coefficient, are presented within the spectral region 220-850 nm. For determining these spectral dependences a multi-sample modification of the combined optical method based on a simultaneous interpretation of experimental data corresponding to variable angle spectro-scopic ellipsometry and near-normal spectroscopic reflectometry is used. Further, physical models and an iterative procedure enabling us to determine the spectral dependences of the optical constants of both the epitaxial films are described in detail. The spectral dependences of the optical constants are introduced in the forms of curves and tables.

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