Comparative study of multilayers used in monochromators for synchrotron-based coherent hard X-ray imaging

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Authors	RACK A. WEITKAMP T. RIOTTE M. GRIGORIEV D. RACK T. HELFEN L. BAUMBACH T. DIETSCH R. HOLZ T. KRÄMER M. SIEWERT F. MEDUŇA Mojmír CLOETENS P. ZIEGLER E.
Year of publication	2010
Type	Article in Periodical
Magazine / Source	Journal of Synchrotron Radiation
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	multilayer mirrors; X-rays; X-ray optics; coherence; X-ray monochromators; X-ray imaging; X-ray phase contrast
Description	A systematic study is presented in which multilayers of different composition (W/Si, Mo/Si, Pd/B4C), periodicity (from 2.5 to 5.5 nm) and number of layers have been characterized. In particular, the intrinsic quality (roughness and reflectivity) as well as the performance (homogeneity and coherence of the outgoing beam) as a monochromator for synchrotron radiation hard X-ray micro-imaging are investigated. The results indicate that the material composition is the dominating factor for the performance.
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