Application of the wavelet transformation in AFM data analysis

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Authors

KLAPETEK Petr OHLÍDAL Ivan

Year of publication 2005
Type Article in Periodical
Magazine / Source Acta Physica Slovaca
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords AFM; Wavelet transform
Description In this article the possibilities of the wavelet transform use within atomic force microscopy data processing are presented. Both discrete and continuous wavelet transform is used for different processing and analytical purposes including denoising, AFM scan error detection, background removal and multifractal analysis. It is shown that the use of wavelet transform can be very effective within AFM data analysis, namely for highly irregular data.
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