Depth profiling of W–Ta based fusion-relevant samples using picosecond laser ablation

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Authors

SONI Shweta ATIKUKKE Sahithya VEIS Matej BOLOUKI Nima ĎURINA Pavol DVOŘÁK Pavel MRKVIČKOVÁ Martina GRIGORE Eduard VEIS Pavel

Year of publication 2024
Type Article in Periodical
Magazine / Source Spectrochimica Acta Part B: Atomic Spectroscopy
MU Faculty or unit

Faculty of Science

Citation
Web https://www.sciencedirect.com/science/article/pii/S0584854724000740
Doi http://dx.doi.org/10.1016/j.sab.2024.106930
Keywords Ps-LIBS; CF-LIBS; Tungsten; WTa(D); GDOES; Confocal microscopy; Depth profile; Ablation rate
Description This study presents a detailed picosecond LIBS analysis of WTa coatings on Molybdenum substrate with varying layer thicknesses for fusion relevant applications. Ps-LIBS is performed on three WTa layers; two without deuterium (~7 µm thickness) and one with deuterium (~1 µm thickness). The LIBS measurements are conducted under argon gas flow at 5±0.2 mbar pressure with different laser pulse energies (1 mJ, 3 mJ) and 100 spectra are recorded consecutively at one spot on the sample for different set of gate delay/gate width (200/200 ns, 300/300 ns, 450/450 ns). The obtained LIBS and Glow-Discharge Optical Emission Spectroscopy (GDOES) depth profiles are compared with the confocal microscopic measurements showing good agreement. Additionally, the ablation rate and layer thickness are calculated for different experimental conditions. The Calibration-Free LIBS approach is used for elemental analysis and the results are compared with GDOES results. The capability of ps-LIBS to quantify Ta in WTa alloy is explored for 2 at.% of Ta. However, due to higher ablation rate of laser and thin coating in WTaD sample, the layer is irradiated in few laser pulse and therefore, CF-LIBS analysis is not performed for it.
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