Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie

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Title in English Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry
Authors

OHLÍDAL Ivan

Year of publication 1999
Type Article in Periodical
Magazine / Source Jemná mechanika a optika
MU Faculty or unit

Faculty of Science

Citation
Field Optics, masers and lasers
Description In this paper the ellipsometric method enabling us to determine the values of all the optical parameters, ie. the values of the refractive indices and thicknesses, of non-absorbing double layers and triple layers placed onto absorbing substrate is described.
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