Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie
Title in English | Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry |
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Authors | |
Year of publication | 1999 |
Type | Article in Periodical |
Magazine / Source | Jemná mechanika a optika |
MU Faculty or unit | |
Citation | |
Field | Optics, masers and lasers |
Description | In this paper the ellipsometric method enabling us to determine the values of all the optical parameters, ie. the values of the refractive indices and thicknesses, of non-absorbing double layers and triple layers placed onto absorbing substrate is described. |
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