Quantitative Study of Interface Roughness Replication in Multilayers Using X-ray Reflectivity and Transmission Electron Microscopy

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Authors	CHLÁDEK M. HOLÝ Václav
Year of publication	1996
Type	Article in Periodical
Magazine / Source	Appl. Phys. Lett.
MU Faculty or unit	Faculty of Science
Citation
Field	Theoretical physics
Related projects:	Physical properties of new materials and layered structures