Island size evolution and molecular diffusion during growth of organic thin films followed by time-resolved specular and off-specular scattering
| Authors | |
|---|---|
| Year of publication | 2014 |
| Type | Article in Periodical |
| Magazine / Source | Physical Review B |
| MU Faculty or unit | |
| Citation | |
| web | http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.045410 |
| Doi | http://dx.doi.org/10.1103/PhysRevB.90.045410 |
| Field | Solid matter physics and magnetism |
| Keywords | Thin film growth; organic semiconductors; X-ray scattering; molecular beam deposition |
| Description | We report on a combined off-specular and specular x-ray scattering growth study of ultrathin films of the prototypical organic semiconductor diindenoperylene (DIP, C32H16). We investigate the evolution of the in-plane correlation length and the growth kinetics of the films including their dependence on the substrate temperature and the growth rate. We observe a temperature-dependent collective rearrangement of DIP molecules from a transient surface induced to the thin-film phase, which can be rationalized by incorporating a thickness-dependent out-of-plane lattice parameter. We further observe that the nucleation behavior of DIP changes from the first to the second monolayer, which we relate to a difference in the diffusion length of the molecules. |
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