Fault Collapsing and Test Generation for a Circuit
| Authors | |
|---|---|
| Year of publication | 2013 |
| Type | Article in Proceedings |
| Conference | Deterioration, Dependability, Diagnostics 2013 |
| MU Faculty or unit | |
| Citation | |
| Field | Informatics |
| Keywords | fault list generation; test vector generation; fault paths |
| Attached files | |
| Description | A novel method to generate a complete list of faults and their corresponding test vectors for a gate-level circuit is presented. This method creates the distinguishable faults of a circuit based on the paths they propagate, along with the test vector(s) for each fault. While the other available methods for fault list and test vector generation are expensive, this method tries to reduce the cost by avoiding all the unnecessary steps and merging the two tasks together. |
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