Project information
Physical properties of new materials and layered structures

Information

This project doesn't include Faculty of Economics and Administration. It includes Faculty of Science. Official project website can be found on muni.cz.

Project Identification

MSM 143100002

Project Period

1/1999 - 12/2004

Investor / Pogramme / Project type

Ministry of Education, Youth and Sports of the CR

Research Intents

MU Faculty or unit

Faculty of Science

prof. RNDr. Josef Humlíček, CSc.

Keywords

semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection

Results

Publications

Total number of publications: 212

1999

Structural characterization of lamellar multilayer gratings by X-ray reflectivity and scanning electron microscopy

JERGEL M. MIKULÍK Petr MAJKOVÁ E. LUBY Š. SENDERÁK R. PINČÍK E. BRUNEL M. KOSTIČ I. KONEČNÍKOVÁ A.

Article in Periodical

J. Phys. D: Appl. Phys., year: 1999, volume: 32, edition: 9999
The far-infrared in-plane conductiivity of YBaCuO studied by ellipsometry

GOLNIK A. BERNHARD Ch. HUMLÍČEK Josef KLAESER M. CARDONA M.

Article in Periodical

physics status solidi (b), year: 1999, volume: 215, edition: 1
X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering

MIKULÍK Petr BAUMBACH T.

Article in Periodical

Phys. Rev. B, year: 1999, volume: 59, edition: 11
X-ray reflection from self-organized interfaces in an SiGe/Si multilayer

GRIM Jan HOLÝ Václav KUBĚNA Josef DARHUBER A.A. ZERLAUTH S. BAUER G.

Article in Periodical

Semicond. Sci. Technol., year: 1999, volume: 14(1999), edition: -

1998

Coplanar and grazing incidence x-ray diffraction investigation of self-organized SiGe quantum dot multilayers

HOLÝ Václav DARHUBER A.A. STANGL J. ZERLAUTH S. SCHAFFER F. BAUER G. DAROWSKI N. LUBBERT D. PIETSCH U.

Article in Periodical

Physical Review B, year: 1998, volume: (58)1998, edition: 12
Ellipsometry and transport studies of thin-film metal nitrides

HUMLÍČEK Josef NEBOJSA Alois HORA J. STRÁSKÝ M. SPOUSTA J. ŠIKOLA T.

Article in Periodical

Thin Solid Films, year: 1998, volume: 1998, edition: 332
Infrared ellipsometry of LiF

HUMLÍČEK Josef

Article in Periodical

Thin Solid Films, year: 1998, volume: 1998, edition: 313-314
Oblique roughness replication in strained SiGe/Si multilayers

HOLÝ Václav DARHUBER A.A. STANGL J. BAUER G. NUETZEL J. ABSTREITER G.

Article in Periodical

Physical Review B, year: 1998, volume: (57)1998, edition: 19
Optical functions of silicon at high temperatures

ŠIK Jan HORA Jaroslav HUMLÍČEK Josef

Article in Periodical

Journal of Applied Physics, year: 1998, volume: 1998, edition: 11
Self-organized growth of three-dimensional quantum-dot crystals with fcc-like stacking and a tunable lattice constant

SPRINGHOLZ G. HOLÝ Václav PINCZOLITS M. BAUER G.

Article in Periodical

Physical Review Letters, year: 1998, volume: 282(1998), edition: 23