Optical characterisation of a thick MOVPE InSb film on GaAs

Lorenc,  Michal; Šik,  Jan; Nebojsa,  Alois; Navrátil,  Karel; Humlíček,  Josef; Vorliček, V.; Hulicius, E.

Optical characterisation of a thick MOVPE InSb film on GaAs

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Authors	LORENC Michal ŠIK Jan NEBOJSA Alois NAVRÁTIL Karel HUMLÍČEK Josef VORLIČEK V. HULICIUS E.
Year of publication	1999
Type	Article in Proceedings
Conference	Workshop proceedings EW MOVPE VIII
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	MOVPE; InSb; ellipsometry; reflectance; Raman; annealing
Description	Optical characterisation of a thick MOVPE InSb film on GaAs
Related projects:	Quantum dots in III - V semiconductors Physical properties of new materials and layered structures