Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

• Authors: DARHUBER A.A.; STANGL J.; HOLÝ Václav; BAUER G.; KROST A.; GRUNDMANN M.; BIMBERG D.; USTINOV V.M.; KOP'EV P.S.; KOSOGOV A.O.; WERNER P.
• Year of publication: 1997
• Type: Article in Periodical
• Magazine / Source: Thin Solid Films
• MU Faculty or unit: Faculty of Science
• Field: Solid matter physics and magnetism

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