Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

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Authors

DARHUBER A.A. STANGL J. HOLÝ Václav BAUER G. KROST A. GRUNDMANN M. BIMBERG D. USTINOV V.M. KOP'EV P.S. KOSOGOV A.O. WERNER P.

Year of publication 1997
Type Article in Periodical
Magazine / Source Thin Solid Films
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
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