X-ray double and triple crystal diffractometry of silicon crystals with small defects

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Authors	HOLÝ Václav KUBĚNA Josef
Year of publication	1993
Type	Article in Periodical
Magazine / Source	Phys. Stat. Sol. (b)
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Related projects:	Physical properties of new materials and layered structures