LA-ICP-MS analysis of metal layers on samples of cultural heritage
| Authors | |
|---|---|
| Year of publication | 2019 |
| Type | Article in Periodical |
| Magazine / Source | Chemical Papers |
| MU Faculty or unit | |
| Citation | |
| Web | Full Text |
| Doi | http://dx.doi.org/10.1007/s11696-019-00745-6 |
| Keywords | Laser ablation; Inductively coupled plasma mass spectrometry; Depth profiling; X-ray fluorescence spectroscopy; Metal layer |
| Description | LA-ICP-MS (laser ablation inductively coupled plasma mass spectrometry) was applied as a semi-destructive method for the analysis of metal layers on samples of cultural heritage. The LA system operates at a wavelength of 193 nm with a pulse duration of 4 ns. The laser ablation was performed using spot mode with a diameter of 110 mu m. This method was developed using eight varied reference samples with a defined layer depth and composition. Four real samples of watch cases were analysed, and the layer composition and thickness were determined together with two test reference samples. The analytical results were compared with X-ray fluorescence spectroscopy analysis. The layer thickness was additionally determined by scanning electron microscopy on the cross section of selected samples. |
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