Project information
Physical properties of new materials and layered structures
- Project Identification
- MSM 143100002
- Project Period
- 1/1999 - 12/2004
- Investor / Pogramme / Project type
-
Ministry of Education, Youth and Sports of the CR
- Research Intents
- MU Faculty or unit
- Faculty of Science
- Keywords
- semiconductors;low-dimensional structures;quantum dots;organic layers;ferroelectrics;high-temperature superconductors;ellipsometry;reflectometry;x-ray diffraction;x-ray reflection
Results
Publications
Total number of publications: 212
1995
-
Strain relaxation and misfit dislocations in compositionally graded Si 1-x Ge x layers on Si (001)
Journal of Crystal Growth, year: 1995, volume: 1995, edition: 157
-
Theoretical study of band-edge states in Sn 1 Ge n strained-yer superlattices
Physical Review B, year: 1995, volume: 52(1995), edition: 7
-
X-ray diffraction on Fibonacci superlattices
Acta Crystallographica A, year: 1995, volume: 51, edition: 9999
1994
-
Analysis of strain and mosaicity in a short-period Si 9 Ge 6 superlattice by x-ray diffraction
Appl. Phys. Lett., year: 1994, volume: 64, edition: 2
-
Diffuse x-ray scattering from non-ideal periodical crystalline multilayers
Appl. Phys. A, year: 1994, volume: 58(1994), edition: -
-
Diffuse x-ray scattering from p+ porous silicon by triple axis diffractometry
Appl. Phys. Lett., year: 1994, volume: 65, edition: 12
-
Electronic structure of Sn/Ge superlattices
Physical Review B, year: 1994, volume: 49(1994), edition: 16
-
Far-infrared response of free carriers in YBA 2 Cu 3 O 7 from ellipsometric measurements
Physica C, year: 1994, volume: 222, edition: 1
-
Fractal structure in optical spectra of Fibonacci superlattices
J.Phys.: Condens. Matter, year: 1994, volume: 6(1994), edition: -
-
High resolution x-ray triple axis diffractometry of short period Si m Ge n superlattices
Jpn. J. Appl. Phys., year: 1994, volume: 33, edition: 4B